• Qualitative phase identification
• Semi-quantitative phase analysis
• Quantitative phase analysis (Rietveld refinement)
• Crystallinity analysis
• Crystallite size and microstrain analysis
• Powder XRD analysis of crystalline and semicrystalline material

• Crystalline and semi-crystalline materials
• Amorphous materials can be analyzed to evaluate the presence of detectable crystalline phases
• Powders: approximately 20 mg–3 g
• Solids: <35 mm (diameter) × 7 mm (height)

X-ray diffraction (XRD) characterizes crystalline materials by irradiating a sample with an X-ray beam and measuring the intensity of the X-rays diffracted by the crystal structure. As the incident angle changes, crystalline phases produce characteristic diffraction peaks at specific angles. The resulting diffraction pattern provides information about the crystalline phases and structure of the sample and can be used for phase identification and semiquantitative or quantitative phase analysis.

• Identification of crystalline phases
• Semi-quantitative and quantitative phase analysis
• Information on crystallinity and crystalline structure
• Crystallite size and microstrain analysis, when appropriate
• Phase detection limits depend on the phase, sample matrix, crystallinity, sample preparation, and measurement conditions; minor phases at approximately 1 wt% may be detected under favorable conditions.