• Qualitative and quantitative elemental analysis
• Semi-quantitative analysis (standardless)
• Major and minor element analysis (ppm levels)
• Point and multi-point analysis
• Elemental mapping
• Analysis of powders, solids, liquids, and thin films

• Powders: approximately 5 mg–10 g, depending on
sample preparation and analysis
• Solid samples and films: maximum approximately 50
mm diameter × 30 mm height
• Liquids: minimum approximately 20 mL
• Samples should be representative of the material
being analyzed and suitable for XRF measurement

X-ray fluorescence (XRF) spectroscopy determines the elemental composition of a sample by irradiating it with an X-ray beam. The incident X-rays excite atoms in the sample, causing them to emit characteristic X-rays. In wavelength-dispersive XRF (WDXRF), analyzing crystals separate the emitted X-rays according to wavelength, allowing individual elements to be identified and quantified with high spectral resolution. The ZSX Primus IV can perform qualitative, semi-quantitative, and quantitative elemental analysis, including standardless analysis for many sample types.

• Elemental range: B–U (boron to uranium)
• Concentration range: Major elements (up to 100%) to
minor and trace elements (ppm levels), depending on the element and sample matrix
• Detection limits vary depending on the element, sample matrix, concentration, and measurement
conditions.
• Qualitative, semi-quantitative, and quantitative elemental analysis
• Point, multi-point, and elemental mapping analysis (minimum step size: 500 µm)