Bryan D. Huey

Department Head and Centennial Term Professor

Department of Materials Science and Engineering

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Education

• Marshall-Sherfield Fellowship and NSF International Post Doctoral Fellow, Oxford University, UK, Dept. of Materials, 1999-2002
• Ph.D., University of Pennsylvania, 1999

Research Focus

• Tomographic AFM
• High Speed AFM
• Chalcogenide (Phase Change Memory) Switching Dynamics
• Ferroelectric Switching Dynamics
• Fuel cell electrode nanostructure
• Cellular response to nano/chemo/mechanical stimuli
• Performance of Nanostructured Photovoltaics

Awards and Service

• Conference Co-Organizer, Fall MRS, 2019
• Fulrath Award (American Ceramics Society), 2016
• Chair: Basic Science Division, American Ceramic Society, 2014/15
• Conference Co-Organizer: Electronic Materials and Applications, 2013
• VELUX Visiting Professor, Villum Foundation, iNANO Institute, Aarhus University, Denmark, 2011-2012
• Outstanding faculty member (teaching, research, service), UConn MSE, 2007
• NRC Fellowship, 2003-2004
• NSF International Postdoctoral Award, 2001
• Marshall-Sherfield Fellowship, 2000
• S. J. Stein Prize, outstanding Engineering Thesis, University of Pennsylvania, 1999
• Materials Research Society, graduate student Gold Medal, Fall 1998
• William S. Yerger Memorial Prize, outstanding graduate student, University of Pennsylvania, 1996

Publications

Katherine Atamanuk, Myles C.Thomas, Robert C. Wadams, Will Linthicum, Weili Yu, Bryan D.Huey, “Atomic force microscopy to identify dehydration temperatures for small volumes of active pharmaceutical ingredients,” Powder Technology, 360, p 1271-1277, 2020.

James J. Steffes, Roger A. Ristau, Ramamoorthy Ramesh, Bryan D. Huey, “Thickness scaling of ferroelectricity in BiFeO3 by tomographic atomic force microscopy,” PNAS, 116 (7), p. 2413-2418, 2019.

Varun Vyas, Michael Lemieu, David A. Knecht, Oleg V. Kolosov, Bryan D. Huey, Micro- Acoustic-Trap (μAT) for microparticle assembly in 3D, Ultrasonics Sonochemistry, 57, p. 193-202, 2019.

Varun Vyas, Melani Solomon, Gerard G. M. D’Souza, Bryan D. Huey, “Nanomechanical Analysis of Extracellular Matrix and Cells in Multicellular Spheroids,” Cellular and Molecular Bioengineering, 12, p. 203–214, 2019.

B. D. Huey, J. Luria, D. A. Bonnell, “SPM in Materials Science,” Springer Handbook of Microscopy, ed. P. Hawkes and J. Spence, 2019.

J.J. Steffes, R.A. Ristau. R. Ramesh, B.D. Huey, “Thickness Scaling of Ferroelectricity in BiFeO3 by Tomographic Atomic Force Microscopy,” PNAS, 1806074116, 2019.

M.R. Chowdhury, J. Steffes, B.D. Huey, J.R. McCutcheon, “3D printed polyamide membranes for desalination,” Science, 361 [6403], 682-686, 2018.

K. Atamanuk, J. Luria, B. D. Huey, “Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics,” Beilstein J. Nanotechnol., 9, 1802-1808, 2018.

R. Keech, L. Ye, J. L. Bosse, G. Esteves, J. Guerrier, J. L. Jones, M. A. Kuroda, B. D. Huey, S. Trolier-McKinstry, Declamped Piezoelectric Coefficients in Patterned 70/30 Lead Magnesium Niobate–Lead Titanate Thin Films, Advanced Functional Materials, 27 (9), 1605014, 2017.

J. Luria, Y. Kutes, A. Moore, L. Zhang, E. Stach, B. D. Huey, Charge Transport in CdTe Solar Cells Revealed by Conductive Tomographic Atomic Force Microscopy, Nature Energy, p. 16150 (1-6), 2016.

Y. Kutes, Y. Zhou, J. Bosse, J. Steffes, N. P. Padture, B. D. Huey, Mapping the Photoresponse of CH3NH3PbI3 Hybrid Perovskite Thin Films at the Nanoscale, Nanoletters, 16 (6), 3434-41, 2016.

J. T. Heron, J. Bosse, Q. He, Y. Gao, M. Trassin, L. Ye, J. D. Clarkson, C. Wang, J. Liu, S. Salahuddin, D. C. Ralph, D. G. Schlom, J. Iniguez, B. D. Huey, R. Ramesh, “Deterministic Switching of Ferromagnetism at Room Temperature Using an Electric Field,” Nature, 516, 370-73, 2014.

Y. Kutes, L. Ye, Y. Zhou, S. Pang, B. D. Huey, N. P. Padture, “Direct Observation of Ferroelectric Domains in Solution-Processed CH3NH3PbI3 Perovskite Thin Films,” JPCL, 5 (19), 3335–3339, 2014.

B. D. Huey, R. Nath, S. Lee, N. A. Polomoff, “High Speed SPM Applied for Direct Nanoscale Mapping of the Influence of Defects on Ferroelectric Switching Dynamics,” J. ACerS (& cover), 95 [4] 1147-1162, 2012.

S. Verma, B. D. Huey, D. J. Burgess, “Scanning probe microscopy method for nanosuspension stabilizer selection,” Langmuir, 25 (21), pp. 12481-7, 2009.

B. D. Huey, “AFM and Acoustics: Fast, Quantitative, Nanomechanical Mapping,” Annual Reviews of Materials Research, 37, 2007, p. 351-85