Surface Profilometry – Zygo New View 5000

ZygoNewView5000
  • 2.5, 10, 50 x objectives
  • Surface topography
  • Step height
  • Waviness

Less than 8” width and depth and 4” height. Samples should be reflective or able to be made reflective

Optical profilometry utilizes white light interferometry to analyze a surface. Surface reflected light creates constructive and destructive interference with a reference light beam in the detector which correlates to surface topography.

Surface topographical constraints: Average roughness, waviness, step height

Lab Location: Mechanical Testing Lab
Lab Manager: Nicholas Eddy
nicholas.eddy@uconn.edu
860-486-2568